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Analysis of multilayer materials using micro-Raman spectroscopy

Depth-direction measurements using Raman spectroscopy! Material analysis of each layer is possible from the surface of multilayer films.

Our "Micro Raman Spectrophotometer" employs a confocal optical system, allowing for the adjustment of the focal position in the depth direction, similar to a microscope, enabling material analysis of each layer from the surface of multilayer films. Using the confocal function of the micro Raman spectrophotometer, the focus of the Raman laser light can be varied in the depth direction. Additionally, by continuously changing the focal position, it is possible to acquire spectra continuously in the depth direction. 【Features】 ■ Adoption of a confocal optical system ■ Enables material analysis of each layer from the surface of multilayer films ■ Capable of varying the focus of the Raman laser light in the depth direction ■ Allows for continuous acquisition of spectra in the depth direction *For more details, please refer to the PDF document or feel free to contact us.

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